Diffuse multiple scattering pattern analysis
14 Jul 2020







A diffuse multiple scattering (DMS) pattern from Diamond Light Source

​Collaborating Facility: Diamond Light Source

​​Diffuse multiple scattering (DMS) is a powerful new X-ray technique that can provide information about all the phases (crystal structures) present in a material sample at unprecedented resolution. However, highly complex data analysis requirements currently limit the application of this technique. This project is developing neural networks that can take a DMS pattern and automatically infer the crystal structures present as well as providing an estimate of the lattice parameters of the materials. The methods developed will be applied in the analysis of DMS patterns for important technological systems such as ferroelectrics and alloys.

Contact: Butler, Keith (STFC,RAL,SC)